... for many different applications: Academic, Pharmaceuticals, Chemical & Petrochemical, Material Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics ... quantification, Reflectivity analysis, Residual stress analysis,Crystallography, Texture analysis, Transmission, Thin film analysis.DX-DWZ Combination of Eulerian cradle for stress and ...