X-ray fluorescence analyzer/xrf analyzer/X-ray fluorescence spectrometer
Measuring element:Mg,Al,Si,S,P,K,Ba,Cr,S,Ti,V,Ca,Fe,Mn,Pb,Zn,Cu,Ni,Mo,As and so on;
Technical parameters:
1.Si-PIN Semiconductor detector,resolution of better than 150ev;
2.Analysis range:0.1%-99.9%;
3.Energy analysis:2-30kev;
4.8 hours of continuous determinationRSD≤0.25%;
5.Temperature coefficient≤0.0004/°C;
6.Working environment temperature:-10~45°C;
7.Standard deviation:≤0.08%(On 12 successive analysis of the same sample data statistics);
8.Laboratory quantitative analyzer;
9.Analysis time:two minutes;
10.Power consumption:<200W;
11.Weight of machine:50Kg;
12.Main specifications:50*50*50cm.
X-ray fluorescence analyzer/xrf analyzer/X-ray fluorescence spectrometer SQ-8800